SCOPUS 정보 검색 플랫폼

Volumn 69, Issue 4, 1997, Pages 289-296

Electron spectroscopic imaging of (Bi,Pb)2Sr2Ca(n-1) Cu(n)O(4+2n+δ) high-T(c) superconducting phases in the TEM

Author keywords

Electron diffraction and elastic scattering theory; Energy filtered imaging and diffraction; Microscopic methods, specifically for solid interfaces and multilayers

Indexed keywords

COMPUTATIONAL METHODS; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON SPECTROSCOPY; IMAGING TECHNIQUES; INTERFACES (MATERIALS); MULTILAYERS; OXIDE SUPERCONDUCTORS; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

BLOCH WAVE CALCULATION; ELASTIC SCATTERING THEORY;

HIGH TEMPERATURE SUPERCONDUCTORS;

ALLOY;

ARTICLE; CONTRAST ENHANCEMENT; ELECTRON DIFFRACTION; RADIATION PHYSICS; RADIATION SCATTERING; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0343376077 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(97)00047-8 Document Type: Article

Times cited : (8)

References (14)

1
- 0028966931
- O. Eibl, J. Microsc. Res. Tech. 30 (1995) 218; A. Narlikar (Ed.), Studies of high-temperature Superconductors, vol. 15; Nova Science publishers, New York, 1995, pp. 51-102.
- (1995) J. Microsc. Res. Tech. , vol.30 , pp. 218
- Eibl, O.¹

2
- 0343820654
- Nova Science publishers, New York
- O. Eibl, J. Microsc. Res. Tech. 30 (1995) 218; A. Narlikar (Ed.), Studies of high-temperature Superconductors, vol. 15; Nova Science publishers, New York, 1995, pp. 51-102.
- (1995) Studies of High-temperature Superconductors , vol.15 , pp. 51-102
- Narlikar, A.¹

3
- 0029511866
- O. Eibl, Superconductor Sci. Technol. 8 (1995) 833.
- (1995) Superconductor Sci. Technol. , vol.8 , pp. 833
- Eibl, O.¹

4
- 0343115210
- to be published
- O. Eibl, to be published.
- Eibl, O.¹

5
- 0025445303
- O. Eibl, Physica C 168 (1990) 249.
- (1990) Physica C , vol.168 , pp. 249
- Eibl, O.¹

6
- 0027708769
- st Annual Meeting Microsc. Soc. Am. (EMSA), 1993, pp. 586-587.
- (1993) st Annual Meeting Microsc. Soc. Am. (EMSA) , pp. 586-587
- Krivanek, O.L.¹ Gubbens, A.J.² Kundman, M.K.³ Carpenter, G.C.⁴

7
- 0029125937
- F. Hofer, P. Warbichler, W. Grogger, Ultramicroscopy 59 (1995) 15.
- (1995) Ultramicroscopy , vol.59 , pp. 15
- Hofer, F.¹ Warbichler, P.² Grogger, W.³

8
- 0002978083
- F. Hofer, P. Warbichler, W. Grogger, O. Lang, Micron 26 (1995) 377.
- (1995) Micron , vol.26 , pp. 377
- Hofer, F.¹ Warbichler, P.² Grogger, W.³ Lang, O.⁴

9
- 0030128867
- F. Hofer, P. Warbichler, Ultramicroscopy 63 (1996) 21.
- (1996) Ultramicroscopy , vol.63 , pp. 21
- Hofer, F.¹ Warbichler, P.²

10
- 0031168403
- M. Leghissa, B. Fischer, B. Roas, A. Jenovelis, J. Wiezoreck, S. Kautz, H.W. Neumüller, C. Reimann, R. Nanke, P. Müller, IEEE Transactions on Applied Superconductivity, Vol. 7, No. 2, 1997, pp. 355-358.
- (1997) IEEE Transactions on Applied Superconductivity , vol.7 , Issue.2 , pp. 355-358
- Leghissa, M.¹ Fischer, B.² Roas, B.³ Jenovelis, A.⁴ Wiezoreck, J.⁵ Kautz, S.⁶ Neumüller, H.W.⁷ Reimann, C.⁸ Nanke, R.⁹ Müller, P.¹⁰

11
- 0000030102
- O.L. Krivanek, A.J. Gubbens, N. Dellby, C.E. Meyer, Microsc. Microanal. Microstruct. 3 (1992) 187.
- (1992) Microsc. Microanal. Microstruct. , vol.3 , pp. 187
- Krivanek, O.L.¹ Gubbens, A.J.² Dellby, N.³ Meyer, C.E.⁴

12
- 0022484844
- H. Shuman, C.F. Chang, A.P. Somlyo, Ultramicroscopy 19 (1986) 121.
- (1986) Ultramicroscopy , vol.19 , pp. 121
- Shuman, H.¹ Chang, C.F.² Somlyo, A.P.³

13
- 0029056771
- P.A. Crozier, Ultramicroscopy 58 (1995) 157.
- (1995) Ultramicroscopy , vol.58 , pp. 157
- Crozier, P.A.¹

14
- 0343987215
- Jones and Begell Publishing, New York
- J. Bentley, E.L. Hall, E.A. Kenik; Proc. Microsc. and Microanalysis, Jones and Begell Publishing, New York, 1995, pp. 268-269.
- (1995) Proc. Microsc. and Microanalysis , pp. 268-269
- Bentley, J.¹ Hall, E.L.² Kenik, E.A.³

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