Structures of nanometre-size crystals determined from selected-area electron diffraction data

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 56, Issue 1, 2000, Pages 29-35

  Weirich, Thomas E ^a,d   Zou, Xiaodong ^a   Ramlau, Reiner ^b   Simon, Arndt ^b   Cascarano, Giovanni Luca ^c   Giacovazzo, Carmelo ^c   Hovmöller, Sven ^a  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c CNR   (Italy)

^d DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; CHEMICAL MODIFICATION; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; PARTICLE SIZE; STANDARDIZATION; STRUCTURE ANALYSIS; TECHNIQUE; THREE DIMENSIONAL IMAGING; X RAY DIFFRACTION;

EID: 0034491704     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767399009605     Document Type: Article

References (29)

1. Altomare, A., Burla, M. C., Camalli, M., Cascarano, G., Giacovazzo, C., Guagliardi, A., Moliterni, A. G. G., Polidori, G. & Spagna, R. (1999). J. Appl. Cryst. 32, 115-118.
2. Cheng, J. & Franzen, H. F. (1996). J. Solid State Chem. 121, 362-371.
3. Conard, B. R., Norrby, L. J. & Franzen, H. F. (1969). Acta Cryst. B25, 1729-1736.
4. Cowley, J. M. (1992). Electron Diffraction Techniques, Vol. 1, edited by J. M. Cowley, pp. 1-74. Oxford University Press.
5. Cowley, J. M. (1993). International Tables for Crystallography, Vol. B, edited by U. Shmueli, p. 280. Dordrecht: Kluwer Academic Publishers.
6. DeRosier, D. J. & Klug, A. (1968). Nature (London), 217, 130-134.
7. Dorset, D. L. (1995). Structural Electron Crystallography. New York: Plenum Press.
8. Dorset, D. L. (1996). Acta Cryst. B52, 753-769.
9. Dorset, D. L. (1998). Acta Cryst. A54, 750-757.
10. Franzen, H. F. & Norrby, L. J. (1968). Acta Cryst. B24, 601-603.
11. Giacovazzo, C. (1998). Direct Phasing in Crystallography. Fundamentals and Applications. Oxford University Press.
12. Gjønnes, J., Hansen, V., Berg, B. S., Runde, P., Cheng, Y. F., Gjønnes, K., Dorset D. L. & Gilmore, C. J. (1998). Acta Cryst. A54, 306-319.
13. Jansen, J., Tang, D., Zandbergen, H. W. & Schenk, H. (1998). Acta Cryst. A54, 91-101.
14. Jiang, J. S. & Li, F. H. (1984). Acta Phys. Sin. 33, 845-849.
15. Nicolopoulos, S., Gonzales-Calbet, J. M., Vallet-Regi, M., Corma, A., Corell, C., Guil, J. M. & Perez-Pariente, J. (1995). J. Am. Chem. Soc. 117, 8947-8956.
16. Owens, J. P., Conard, B. R. & Franzen, H. F. (1967). Acta Cryst. 23, 77-82.
17. Sheldrick, G. M. (1998). SHELXL-91-2. Program for Crystal Structure Refinement. University of Göttingen, Germany.
18. Simon, A. (1997). Angew. Chem. Int. Ed. Engl. 36, 1788-1806.
19. Sinkler, W., Bengu, E. & Marks, L. D. (1998). Acta Cryst. A54, 591-605.
20. Skarnoulis, A. J., Liljestrand, L. & Kihlborg, L. (1979). Chem. Commun. 1, 1-27.
21. Vainshtein, B. K. (1964). Structure Analysis by Electron Diffraction. Oxford: Pergamon Press.
22. Vainshtein, B. K., Zvyagin, B. B. & Avilov, A. S. (1992). Electron Diffraction Techniques, Vol. 2, edited by J. M. Cowley, pp. 216-312. Oxford University Press.
23. Weirich, T. E. (1996). PhD Thesis, Universität Osnabrück, Germany.
24. Weirich, T. E., Hovmöller, S., Kalpen, H., Ramlau, R. & Simon, A. (1998). Crystallogr. Rep. 43, 956-967.
25. Weirich, T. E., Pöttgen, R. & Simon, A. (1996). Z. Kristallogr. 212, 929-930.
26. Weirich, T. E., Ramlau, R., Simon, A., Hovmöller, S. & Zou, X. D. (1996). Nature (London), 382, 144-146.
27. Weirich, T. E., Simon, A. & Pöttgen, R. (1996). Z. Anorg. Allg. Chem. 622, 630-634.
28. Williams, D. B. & Carter, C. B. (1996). Transmission Electron Microscopy, Vol. 2, p. 203. New York: Plenum Press.
29. Zou, X. D., Sukharev, Y. & Hovmöller, S. (1993). Ultramicroscopy, 52, 436-444.