Simulating the oxygen K-edge spectrum from grain boundaries in ceramic oxides using the multiple scattering methodology

Micron

Volumn 31, Issue 4, 2000, Pages 381-399

  Moltaji, H O ^a   Buban, J P ^a   Zaborac, J A ^a   Browning, N D ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Ceramic oxides; Experimental electron energy loss spectra; Grain boundaries; Multiple scattering; Scanning transmission electron microscope

Indexed keywords

EID: 0034059471     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00117-1     Document Type: Article

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