Ti and O K edges for titanium oxides by multiple scattering calculations: Comparison to XAS and EELS spectra

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 16, 1997, Pages 10382-10391

  Wu, Z ^a   Ouvrard, G ^b   Gressier, P ^b  

^a INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000662895     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.10382     Document Type: Article

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