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Volumn 47, Issue 1, 2000, Pages 62-65

SPICE simulation and tradeoffs of CMOS LNA performance with source-degeneration inductor

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC INDUCTORS; ELECTRIC RESISTANCE; IMPEDANCE MATCHING (ELECTRIC); MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE;

EID: 0033909086     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.818895     Document Type: Article
Times cited : (32)

References (5)
  • 2
    • 84888597198 scopus 로고    scopus 로고
    • A robust and physical BSIM3 nonquasistatic transient and AC small-signal model for circuit simulation
    • vol. 45, pp. 834-841, Apr. 1998.
    • M. Chan, K. Y. Hui, C. Hu, and P. K. Ko, "A robust and physical BSIM3 nonquasistatic transient and AC small-signal model for circuit simulation," IEEE Trans. Electron Devices, vol. 45, pp. 834-841, Apr. 1998.
    • IEEE Trans. Electron Devices
    • Chan, M.1    Hui, K.Y.2    Hu, C.3    Ko, P.K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.