Large-signal modelling and measuring go hand-in-hand: Accurate alternatives to indirect S-parameter methods

International Journal of RF and Microwave Computer-Aided Engineering

Volumn 10, Issue 1, 2000, Pages 6-18

  Schreurs, Dominique ^a   Verspecht, Jan ^b,c  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

^c Hewlett Packard EEsof Netwk M   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LARGE-SIGNAL MEASUREMENT-BASED MODELING; NONLINEAR NETWORK MEASUREMENT SYSTEMS (NNMS);

DESCRIBING FUNCTIONS; NEURAL NETWORKS; NONLINEAR NETWORK ANALYSIS; SEMICONDUCTOR DEVICE MODELS;

MICROWAVE INTEGRATED CIRCUITS;

EID: 0033908946     PISSN: 10964290     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-047X(200001)10:1<6::AID-MMCE3>3.0.CO;2-H     Document Type: Article

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