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Volumn 34, Issue 21, 1998, Pages 1993-1994

Direct extraction of nonlinear FET I-V functions from time domain large signal measurements

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; CURRENT VOLTAGE CHARACTERISTICS; MATHEMATICAL MODELS; MICROWAVE MEASUREMENT; NONLINEAR NETWORK ANALYSIS; TIME DOMAIN ANALYSIS; WAVEFORM ANALYSIS;

EID: 0032182321     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19981449     Document Type: Article
Times cited : (26)

References (3)
  • 2
    • 0031371907 scopus 로고    scopus 로고
    • Direct extraction of the non-linear model for two-port devices from vectorial non-linear network analyzer measurements
    • Jerusalem, Israel
    • SCHREURS, D., VERSPECHT, J., NAUWELAERS, B., VAN DE CAPELLE, A., and VAN ROSSUM, M.: 'Direct extraction of the non-linear model for two-port devices from vectorial non-linear network analyzer measurements'. Proc. 27th European Microwave Conf., Jerusalem, Israel, 1997, pp. 921-926
    • (1997) Proc. 27th European Microwave Conf. , pp. 921-926
    • Schreurs, D.1    Verspecht, J.2    Nauwelaers, B.3    Van De Capelle, A.4    Van Rossum, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.