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Volumn 26, Issue 2-3 SPEC. ISS., 1997, Pages 93-100

An Electronic Pattern Speckle Shearing Interferometer for the Measurement of Surface Slope Variations of Three-Dimensional Objects

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; SPECKLE; SURFACE MEASUREMENT;

EID: 0031060027     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00106-9     Document Type: Article
Times cited : (25)

References (11)
  • 2
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    • A review of speckle photography and speckle interferometry
    • Stetson, K. A., A review of speckle photography and speckle interferometry. Opt. Engng, 14 (1985), 482-489.
    • (1985) Opt. Engng , vol.14 , pp. 482-489
    • Stetson, K.A.1
  • 3
    • 77956976680 scopus 로고
    • Speckle interferometry
    • Ennos, A. E., Speckle interferometry. Prog. Optics, 16 (1978), 233-288.
    • (1978) Prog. Optics , vol.16 , pp. 233-288
    • Ennos, A.E.1
  • 4
    • 0002985532 scopus 로고
    • Techniques of displacement and deformation measurements in speckle metrology
    • ed. R. S. Sirohi. Marcel Dekker, New York, Chap. 2
    • Rastogi, P. K., Techniques of displacement and deformation measurements in speckle metrology. In Speckle Metrology, ed. R. S. Sirohi. Marcel Dekker, New York, 1993, Chap. 2, pp. 41-98.
    • (1993) Speckle Metrology , pp. 41-98
    • Rastogi, P.K.1
  • 5
    • 84957465527 scopus 로고
    • New method of contouring using digital speckle pattern interferometry (DSPI)
    • Ganesan, A. R. & Sirohi, R. S., New method of contouring using digital speckle pattern interferometry (DSPI). Proc. SPIE, 954 (1988), 327-332.
    • (1988) Proc. SPIE , vol.954 , pp. 327-332
    • Ganesan, A.R.1    Sirohi, R.S.2
  • 6
    • 84975597937 scopus 로고
    • Contouring by electron speckle pattern interferometry employing dual beam illumination
    • Joenathan, C., Pfister, B. & Tiziani, H. J., contouring by electron speckle pattern interferometry employing dual beam illumination. Appl. Opt., 29 (1990), 1905-1911.
    • (1990) Appl. Opt. , vol.29 , pp. 1905-1911
    • Joenathan, C.1    Pfister, B.2    Tiziani, H.J.3
  • 7
    • 0039099085 scopus 로고
    • Design consideration of a dual-beam ESPI optical system for contouring
    • Diao, H., Zou, Y. & Tiziani, H. J., Design consideration of a dual-beam ESPI optical system for contouring. Optik, 93 (1993), 45-51.
    • (1993) Optik , vol.93 , pp. 45-51
    • Diao, H.1    Zou, Y.2    Tiziani, H.J.3
  • 8
    • 0037905312 scopus 로고
    • Measurement of the derivatives of curved surfaces using speckle interferometry
    • Rastogi, P. K., Measurement of the derivatives of curved surfaces using speckle interferometry. J. Mod. Optics, 41 (1994), 659-661.
    • (1994) J. Mod. Optics , vol.41 , pp. 659-661
    • Rastogi, P.K.1
  • 9
    • 0028439519 scopus 로고
    • Slope contouring of a three-dimensional object using speckle interferometry
    • Rastogi, P. K., Slope contouring of a three-dimensional object using speckle interferometry. Opt. Commun., 108 (1994), 37-41.
    • (1994) Opt. Commun. , vol.108 , pp. 37-41
    • Rastogi, P.K.1
  • 11
    • 0019622060 scopus 로고
    • In-plane displacement and strain measurement by speckle interferometry and moiré derivation
    • Spajer, M., Rastogi, P. K. & Monneret, J., In-plane displacement and strain measurement by speckle interferometry and moiré derivation. Appl. Opt., 20 (1981), 3392-3402.
    • (1981) Appl. Opt. , vol.20 , pp. 3392-3402
    • Spajer, M.1    Rastogi, P.K.2    Monneret, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.