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Volumn 26, Issue 2-3 SPEC. ISS., 1997, Pages 93-100
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An Electronic Pattern Speckle Shearing Interferometer for the Measurement of Surface Slope Variations of Three-Dimensional Objects
a
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERFEROMETRY;
SPECKLE;
SURFACE MEASUREMENT;
ELECTRONIC PATTERN SPECKLE SHEARING INTERFEROMETER;
SURFACE SLOPE VARIATION MEASUREMENT;
SURFACE TOPOGRAPHY;
THREE DIMENSIONAL OBJECTS;
INTERFEROMETERS;
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EID: 0031060027
PISSN: 01438166
EISSN: None
Source Type: Journal
DOI: 10.1016/0143-8166(95)00106-9 Document Type: Article |
Times cited : (25)
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References (11)
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