Cross Influence of Coordinate and Slope Related Fringes during Shearographic Profiling

Optics and Lasers in Engineering

Volumn 26, Issue 2-3 SPEC. ISS., 1997, Pages 259-278

  Tay, C J ^a   Shang, H M ^a   Choong, D ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

SPECKLE; SURFACE MEASUREMENT;

CARRIER FRINGES; FRINGE PATTERNS; SHEAROGRAPHIC PROFILING; SLOPE FRINGES; SPECKLE SHEARING INTERFEROMETRY;

INTERFEROMETRY;

EID: 0031060056     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00117-4     Document Type: Article

References (10)

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10. Hung, Y. Y., Shearography: A new optical method for strain measurement and nondestructive testing. Opt. Engng, 21 (1982), 391-395.