Quantitative investigation of amorphous Fe/Ge and Fe/Si by inelastic peak shape analysis

Surface Science

Volumn 445, Issue 1, 2000, Pages 71-79

  Schleberger, Marika ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; IRON; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

INELASTIC PEAK SHAPE ANALYSIS;

SEMICONDUCTING FILMS;

EID: 0033903267     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01041-9     Document Type: Article

References (17)

1. S. Tougaard, P. Sigmund, Phys. Rev. B 25 (1981) 4452.
2. S. Tougaard, J. Vac. Sci. Technol. A 8 (1990) 2197.
3. S. Tougaard, J. Vac. Sci. Technol. A 14 (1996) 1415.
4. S. Tougaard, Surf. Interf. Anal. 26 (1998) 249.
5. H.S. Hansen, C. Jansson, S. Tougaard, J. Vac. Sci. Technol. A 10 (1992) 2938.
6. C. Jansson, S. Tougaard, J. Vac. Sci. Technol. A 12 (1994) 2332.
7. M. Schleberger, D. Fujita, C. Scharfschwerdt, S. Tougaard, Surf. Sci. 331-333 (1995) 942.
8. M. Schleberger, D. Fujita, C. Scharfschwerdt, S. Tougaard, J. Vac. Sci. Technol. B 13 (1995) 949.
9. M. Schleberger, A. Cohen Simonsen, S. Tougaard, J.L. Hansen, A. Nylandsted Larsen, J. Vac. Sci. Technol. A 15 (1997) 3032.
10. A. Cohen Simonsen, M. Schleberger, S. Tougaard, J.L. Hansen, A. Nylandsted Larsen, Thin Solid Films 338 (1999) 165.
11. S. Toscano, B. Briner, H. Hopster, M. Landolt, J. Magn. Magn. Mater. 114 (1992) L6.
12. P. Walser, M. Schleberger, P. Fuchs, M. Landolt, Phys. Rev. Lett. 80 (1998) 2217.
13. QUASES™, version 2.1. Contact S. Tougard for more information.
14. S. Tougaard, Solid State Commun. 61 (1987) 547.
15. S. Tougaard, Surf. Interf. Anal. 25 (1997) 137.
16. M. Schleberger, P. Walser, M. Hunziker, M. Landolt, Phys. Rev. B 60 (1999) 14360.
17. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interf. Anal. 11 (1988) 577.