Amorphous fe-si and fe-ge nanostructures quantitatively analyzed by x-ray-photoelectron spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 20, 1999, Pages 14360-14365

  Schleberger, Marika ^a   Walser, Peter ^a   Hunziker, Michael ^a   Landolt, Martin ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008714026     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.14360     Document Type: Article

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