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Volumn 113, Issue 9, 2000, Pages 539-542

Ultrafast electron drift velocity overshoot in 3C-SiC

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRIC FIELD EFFECTS; ELECTRON TRANSPORT PROPERTIES; SILICON CARBIDE; ULTRAFAST PHENOMENA;

EID: 0033881103     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(99)00522-0     Document Type: Article
Times cited : (10)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.