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Volumn 113, Issue 9, 2000, Pages 539-542
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Ultrafast electron drift velocity overshoot in 3C-SiC
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
ELECTRIC FIELD EFFECTS;
ELECTRON TRANSPORT PROPERTIES;
SILICON CARBIDE;
ULTRAFAST PHENOMENA;
ULTRAFAST ELECTRON DRIFT VELOCITY OVERSHOOT;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 0033881103
PISSN: 00381098
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1098(99)00522-0 Document Type: Article |
Times cited : (10)
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References (24)
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