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Volumn 15, Issue 2, 2000, Pages 197-202

Subthreshold conduction in short-channel polycrystalline-silicon thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; THERMAL EFFECTS;

EID: 0033880336     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/15/2/320     Document Type: Article
Times cited : (8)

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  • 3
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    • Qian, F.1    Kim, D.M.2    Kawamoto, G.H.3
  • 6
    • 0018032498 scopus 로고
    • Transport properties of polycrystalline silicon films
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  • 7
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  • 8
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    • Chen H-L and Wu C-Y 1998 An analytical grain barrier height model and its characterization for intrinsic poly-Si thin-film transistor IEEE Trans. Electron Devices 45 2245
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    • Chen, H.-L.1    Wu, C.-Y.2
  • 9
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    • Correlation of polysilicon thin-film transistor characteristics to defect states via thermal annealing
    • Chern H N, Lee C L and Lei T F 1994 Correlation of polysilicon thin-film transistor characteristics to defect states via thermal annealing IEEE Trans. Electron Devices 41 460
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 460
    • Chern, H.N.1    Lee, C.L.2    Lei, T.F.3
  • 10
    • 0026854110 scopus 로고
    • Analysis of current-voltage characteristics of low-temperature-processed polysilicon thin-film transistor
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.