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Journal of Electronic Materials

Volumn 29, Issue 4, 2000, Pages 448-451

Changes in electrical characteristics associated with degradation of InGaN blue light-emitting diodes

(3) Fang, Z Q a Reynolds, D C a Look, D C a

a WRIGHT STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); ELECTRIC BREAKDOWN OF SOLIDS; SAPPHIRE; SEMICONDUCTING INDIUM COMPOUNDS; STRAIN; STRESS RELAXATION;

INDIUM GALLIUM NITRIDE;

LIGHT EMITTING DIODES;

EID: 0033871230 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-000-0159-4 Document Type: Article

Times cited : (37)

References (15)

1
- 0003453296
- Heidelberg, Germany: Springer-Verlag
- For a review, see S. Nakamura and G. Fasol, The Blue Laser Diodes (Heidelberg, Germany: Springer-Verlag, 1997).
- (1997) The Blue Laser Diodes
- Nakamura, S.¹ Fasol, G.²

2
- 85042807979
- T. Sugahara, H. Sato, M. Hao, Y. Naoi, S. Kurai, S. Tottori, K. Yamashita, K. Nishino, L.T. Romano, and S. Sakai, Jpn. J. Appl. Phys. 37 (Pt. II), L398 (1998).
- (1998) Jpn. J. Appl. Phys. , vol.37 , Issue.PART. II
- Sugahara, T.¹ Sato, H.² Hao, M.³ Naoi, Y.⁴ Kurai, S.⁵ Tottori, S.⁶ Yamashita, K.⁷ Nishino, K.⁸ Romano, L.T.⁹ Sakai, S.¹⁰

3
- 0000100475
- P. Kozodoy, J.P. Ibbetson, H. Marchand, P.T. Fihi, S. Keller, J.S. Speck, S.P. DenBaars, and U.K. Mishra, Appl. Phys. Lett. 73, 975 (1998).
- (1998) Appl. Phys. Lett. , vol.73 , pp. 975
- Kozodoy, P.¹ Ibbetson, J.P.² Marchand, H.³ Fihi, P.T.⁴ Keller, S.⁵ Speck, J.S.⁶ Denbaars, S.P.⁷ Mishra, U.K.⁸

4
- 0000085190
- D.V. Kuksenkov, H. Temkin, A. Osinsky, R. Gaska, and M.A. Khan, Appl. Phys. Lett. 72, 1365 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 1365
- Kuksenkov, D.V.¹ Temkin, H.² Osinsky, A.³ Gaska, R.⁴ Khan, M.A.⁵

5
- 0001244452
- H.C. Casey, Jr., J. Muth, S. Krishnankutty, and J.M. Zavada, Appl. Phys. Lett. 68, 2867 (1996).
- (1996) Appl. Phys. Lett. , vol.68 , pp. 2867
- Casey H.C., Jr.¹ Muth, J.² Krishnankutty, S.³ Zavada, J.M.⁴

6
- 0003105232
- P.G. Eliseev, P. Perlin, J. Furioli, P. Sartori, J. Mu, and M. Osinski, J. Electron. Mater. 26, 311 (1997).
- (1997) J. Electron. Mater. , vol.26 , pp. 311
- Eliseev, P.G.¹ Perlin, P.² Furioli, J.³ Sartori, P.⁴ Mu, J.⁵ Osinski, M.⁶

7
- 0031346903
- A.E. Yunovich, A.N. Kovalev, V.E. Kudryashov, F.I. Manyakhin, and A.N. Turkin, Mater. Res. Soc. Symp. Proc. 482, 1041 (1998).
- (1998) Mater. Res. Soc. Symp. Proc. , vol.482 , pp. 1041
- Yunovich, A.E.¹ Kovalev, A.N.² Kudryashov, V.E.³ Manyakhin, F.I.⁴ Turkin, A.N.⁵

8
- 0001044226
- J.C. Carrano, T. Li, P.A. Grudowski, C.J. Eiting, R.D. Dupuis, and J.C. Campbell, J. Appl. Phys. 83, 6148 (1998).
- (1998) J. Appl. Phys. , vol.83 , pp. 6148
- Carrano, J.C.¹ Li, T.² Grudowski, P.A.³ Eiting, C.J.⁴ Dupuis, R.D.⁵ Campbell, J.C.⁶

9
- 0032614963
- E.G. Brazel, M.A. Chin, and V. Narayanamurti, Appl. Phys. Lett. 74, 2367 (1999).
- (1999) Appl. Phys. Lett. , vol.74 , pp. 2367
- Brazel, E.G.¹ Chin, M.A.² Narayanamurti, V.³

10
- 0028387914
- D.C. Look, Z.-Q. Fang, J.W. Look, and J.R. Sizelove, J. Electrochem. Soc. 141, 747 (1994).
- (1994) J. Electrochem. Soc. , vol.141 , pp. 747
- Look, D.C.¹ Fang, Z.-Q.² Look, J.W.³ Sizelove, J.R.⁴

11
- 0000955293
- J.B. Fedison, T.P. Chow, H. Lu, and JB. Bhat, Appl. Phys. Lett. 72, 2841 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 2841
- Fedison, J.B.¹ Chow, T.P.² Lu, H.³ Bhat, J.B.⁴

12
- 0004206649
- New York: Academic, Chap. 5
- M.A. Lampert and P. Mark, Current Injection in Solids (New York: Academic, 1970), Chap. 5.
- (1970) Current Injection in Solids
- Lampert, M.A.¹ Mark, P.²

13
- 36849116616
- A.G. Chynoweth and G.L. Pearson, J. Appl. Phys. 29, 1103 (1958).
- (1958) J. Appl. Phys. , vol.29 , pp. 1103
- Chynoweth, A.G.¹ Pearson, G.L.²

14
- 0029377278
- S. Nakamura, M. Senoh, N. Iwasa, and S.-I. Nagahama, Appl. Phys. Lett. 67, 1868 (1995).
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1868
- Nakamura, S.¹ Senoh, M.² Iwasa, N.³ Nagahama, S.-I.⁴

15
- 0000075750
- T. Egawa, T. Jimbo, and M. Umeno, J. Appl. Phys. 82, 5816 (1997).
- (1997) J. Appl. Phys. , vol.82 , pp. 5816
- Egawa, T.¹ Jimbo, T.² Umeno, M.³

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