Monte Carlo simulation for ultra-small MOS devices

Superlattices and Microstructures

Volumn 27, Issue 2, 2000, Pages 137-145

  Ravaioli, U ^a   Winstead, B ^a   Wordelman, C ^a   Kepkep, A ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; COMPUTER SIMULATION; ELECTRON SCATTERING; HOT CARRIERS; IMPACT IONIZATION; INTERFACES (MATERIALS); MONTE CARLO METHODS; SEMICONDUCTING SILICON; SURFACE ROUGHNESS;

ELASTIC SCATTERING; INELASTIC SCATTERING;

MOSFET DEVICES;

EID: 0033751329     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1999.0802     Document Type: Article

References (10)

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