Applications of the 45° reflectometry in the study of optical properties of confined semiconductor systems

Microelectronics Journal

Volumn 31, Issue 6, 2000, Pages 433-438

  Silva Castillo, A ^a   Madrigal Melchor, J ^b   Perez Rodriguez F ^a  

^a BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

^b UNIVERSIDAD AUTÓNOMA DE ZACATECAS   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT POLARIZATION; LIGHT REFLECTION; PHONONS; SEMICONDUCTING FILMS; SEMICONDUCTOR SUPERLATTICES; THIN FILMS;

CONFINED SEMICONDUCTOR SYSTEMS;

REFLECTOMETERS;

EID: 0033745589     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(00)00009-4     Document Type: Article

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