Comparative study of the on-off switching behavior of metal-insulator-metal antifuses

IEEE Electron Device Letters

Volumn 21, Issue 6, 2000, Pages 295-297

  Li, W T ^a   McKenzie, D R ^a   Wiszniewski, W ^b  

^a UNIVERSITY OF SYDNEY   (Australia)

^b Quality Semiconductor Australia   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ELECTRODES; SEMICONDUCTING ALUMINUM COMPOUNDS; SILICON NITRIDE;

METAL-INSULATOR-METAL ANTIFUSES;

MIM DEVICES;

EID: 0033738729     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.843155     Document Type: Article

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