A new metal-to-metal antifuse with amorphous carbon

IEEE Electron Device Letters

Volumn 19, Issue 9, 1998, Pages 317-319

  Liu, S ^a   Lamp, D ^a   Gangopadhyay, S ^a   Sreenivas, G ^b   Ang, S S ^b   Naseem, H A ^b  

^a TEXAS TECH UNIVERSITY   (United States)

^b 3202 Bell Engineering Center   (United States)

Author keywords

Amorphous carbon; Antifuse; FPGA

Indexed keywords

AMORPHOUS MATERIALS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC RESISTANCE; FIELD PROGRAMMABLE GATE ARRAYS; PERMITTIVITY;

AMORPHOUS CARBON; METAL-TO-METAL ANTIFUSES;

DIELECTRIC DEVICES;

EID: 0032165285     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.709626     Document Type: Article

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