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Volumn 9, Issue 3, 2000, Pages 573-576

In situ deposition and etching process of a-C:H:N films in a dual electron cyclotron resonance-radio frequency plasma

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ELECTRON CYCLOTRON RESONANCE; ELLIPSOMETRY; EMISSION SPECTROSCOPY; ETCHING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGENATION; METHANE; NITROGEN; OPTICAL PROPERTIES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY;

EID: 0033738334     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(99)00263-0     Document Type: Article
Times cited : (19)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.