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Volumn 9, Issue 3, 2000, Pages 573-576
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In situ deposition and etching process of a-C:H:N films in a dual electron cyclotron resonance-radio frequency plasma
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
ELECTRON CYCLOTRON RESONANCE;
ELLIPSOMETRY;
EMISSION SPECTROSCOPY;
ETCHING;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HYDROGENATION;
METHANE;
NITROGEN;
OPTICAL PROPERTIES;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
RAMAN SPECTROSCOPY;
CARBON NITRIDE;
CARBON INORGANIC COMPOUNDS;
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EID: 0033738334
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(99)00263-0 Document Type: Article |
Times cited : (19)
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References (24)
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