Oxidation of NiAl(1 0 0) studied with surface sensitive X-ray diffraction

Physica B: Condensed Matter

Volumn 283, Issue 1-3, 2000, Pages 208-211

  Stierle, A ^a   Formoso, V ^a   Comin, F ^a   Schmitz, G ^b   Franchy, R ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; EPITAXIAL GROWTH; OXIDATION; THIN FILM CIRCUITS; TWINNING; X RAY CRYSTALLOGRAPHY;

CRYSTAL TRUNCATION; NICKEL ALUMINIDE; REFLECTION SPLITTING;

NICKEL ALLOYS;

EID: 0033733386     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01944-4     Document Type: Article

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