Oxidation induced roughening during Cr2O3(0001) growth on Cr(110)

Surface Science

Volumn 385, Issue 1, 1997, Pages 167-177

  Stierle, A ^a,b   Zabel, H ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Chromium; Diffraction, and reflection; Growth; Low index single crystal surfaces; Molecular beam epitaxy; Oxidation; Oxygen; Reflection high energy electron diffraction (RHEED); Single crystal surfaces; X ray scattering

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; FILM GROWTH; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; OXIDATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; SURFACE ROUGHNESS; THERMAL EFFECTS;

LOW INDEX SINGLE CRYSTALS;

CHROMIUM;

EID: 0031208405     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00257-4     Document Type: Article

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