SCOPUS 정보 검색 플랫폼

Synthetic Metals

Volumn 111, Issue , 2000, Pages 253-256

Growth mechanism of black spots in polymer EL device

(5) Kim, Seong Hyun a Chu, Hye Yong a Zyung, Taehyoung a Do, Lee Mi a Hwang, Do Hoon a

a Electronics and Telecommunications Research Institute (ETRI) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; ELECTRIC CURRENT MEASUREMENT; ELECTRIC SPARKS; GROWTH (MATERIALS); MATHEMATICAL MODELS; SEMICONDUCTING POLYMERS; SEMICONDUCTOR DEVICE MANUFACTURE; TIME DOMAIN ANALYSIS;

BLACK SPOTS; CURRENT VOLTAGE MEASUREMENTS; POLYMER ELECTROLUMINESCENCE DEVICE; POLYMETHOXY ETHYLHEXYLOXYPHENYLENEVINYLENE;

LUMINESCENT DEVICES;

EID: 0033717123 PISSN: 03796779 EISSN: None Source Type: Journal
DOI: 10.1016/S0379-6779(99)00375-6 Document Type: Article

Times cited : (8)

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