In situ investigation of degradation in polymeric electroluminescent devices using time-resolved confocal laser scanning microscope

Applied Physics Letters

Volumn 70, Issue 25, 1997, Pages 3470-3472

  Do, Lee Mi ^a   Kim, Kwangjoon ^a   Zyung, Taehyoung ^a   Shim, Hong Ku ^b   Kim, Jang Joo ^c  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000382980     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118516     Document Type: Article

References (21)

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