XPS, LEED and STM study of thin oxide films formed on Cr(110)

Surface Science

Volumn 458, Issue 1, 2000, Pages 195-215

  Maurice, V ^a   Cadot, S ^a   Marcus, P ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ANNEALING; FILM GROWTH; HYDRATION; LOW ENERGY ELECTRON DIFFRACTION; NUCLEATION; SCANNING TUNNELING MICROSCOPY; STOICHIOMETRY; STRUCTURE (COMPOSITION); THICKNESS MEASUREMENT; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHROMIUM OXIDE THIN FILMS; LOW INDEX SINGLE CRYSTAL SURFACES;

CHROMIUM;

EID: 0033714664     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00439-8     Document Type: Article

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