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Volumn 441, Issue 2-3, 1999, Pages

X-ray structure analysis of the Cr2O3(0001)-(1 × 1) surface: evidence for Cr interstitial

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHROMIUM COMPOUNDS; ELECTRONIC STRUCTURE; ELECTROSTATICS; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; ORDER DISORDER TRANSITIONS; TEMPERATURE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0033225462     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00870-5     Document Type: Article
Times cited : (44)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.