|
Volumn 441, Issue 2-3, 1999, Pages
|
X-ray structure analysis of the Cr2O3(0001)-(1 × 1) surface: evidence for Cr interstitial
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALUMINA;
CHROMIUM COMPOUNDS;
ELECTRONIC STRUCTURE;
ELECTROSTATICS;
FILM GROWTH;
LOW ENERGY ELECTRON DIFFRACTION;
ORDER DISORDER TRANSITIONS;
TEMPERATURE;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
CHROMIUM OXIDES;
COULOMB INTERACTION;
SURFACE X RAY DIFFRACTION;
SURFACE STRUCTURE;
|
EID: 0033225462
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00870-5 Document Type: Article |
Times cited : (44)
|
References (24)
|