Effect of crystallographic texture on ferroelectric performance of PZT thin films

Materials Research Society Symposium - Proceedings

Volumn 596, Issue , 2000, Pages 205-210

  Fox, G R ^a  

^a Ramtron International Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTALLIZATION; DEGRADATION; ELECTRODES; ELECTROMAGNETIC WAVE POLARIZATION; FATIGUE OF MATERIALS; FERROELECTRICITY; LEAD COMPOUNDS; SPUTTER DEPOSITION; TEXTURES; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC TEXTURE; LEAD ZIRCONATE TITANATE THIN FILMS; SWITCHABLE POLARIZATION;

THIN FILMS;

EID: 0033714099     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. T.D. Hadnagy and T. Davenport, Integrated Ferroelectrics, 22, p. 183 (1998).
2. G.R. Fox in Ferroelectric Thin Films VII, edited by R.E. Jones, R.W. Schwartz, S.R. Summerfelt, and I.K. Koo (Mater. Res. Soc. Proc. 541, Warrendale, PA 1999), p. 529-534.
3. T.D. Hadnagy, Integrated Ferroelectrics, 18, p. 1 (1997).
4. S.D. Traynor, T.D. Hadnagy, and L. Kammerdiner, Integrated Ferroelectrics, 16, p. 63 (1997).