X-ray diffraction method for determining textured volume fractions in PZT thin films

Materials Research Society Symposium - Proceedings

Volumn 541, Issue , 1999, Pages 529-534

  Fox, G R ^a  

^a Ramtron International Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; NONVOLATILE STORAGE; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

LEAD ZIRCONIUM TITANATE; X RAY ABSORPTION;

THIN FILMS;

EID: 0032592294     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)

1. S. Chen and I. Chen, J. Am. Ceram. Soc. 77, p. 2337 (1994).
2. K.G. Brooks, I.M. Reaney, R. Klissurska, Y. Huang, L. Bursill, and N. Setter, J. Mater. Res. 9, p. 2540 (1994).
3. C.R. Peterson, N.W. Medendorp, E.B. Slamovich, and K.J. Bowman, (Mater. Res. Soc. Proc. 433, Pittsburgh, PA 1996).
4. nd edition, Addison-Wesley Publishing Co., Inc.,Reading, Massachusetts, 1978, pp. 107-145.
5. th Inter. Symp. Integrated Ferroelectrics, 1998.