Cubic CdS thin films studied by spectroscopic ellipsometry

Journal of Materials Science: Materials in Electronics

Volumn 8, Issue 6, 1997, Pages 399-403

  Martinez J L ^a   Martinez G ^a   Torres Delgado, G ^a   Guzman O ^b   Del Angel, P ^b   Zelaya Angel, O ^a   Lozada Morales, R ^c  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b INSTITUTO MEXICANO DEL PETRÓLEO   (Mexico)

^c BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC VARIABLES MEASUREMENT; ELECTRON DIFFRACTION; ELLIPSOMETRY; FILM GROWTH; GLASS; OPTICAL PROPERTIES; SEMICONDUCTING CADMIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR PHASE EPITAXY; X RAY DIFFRACTION;

CHEMICAL BATH DEPOSITION; CRYSTALLOGRAPHIC PROPERTY; CUBIC PHASE; DIELECTRIC FUNCTION; SPECTROELLIPSOMETRY; VOID FRACTION; X RAY DIFFRACTION PATTERN;

THIN FILMS;

EID: 0031387230     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018555826924     Document Type: Article

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