Reciprocal-space and real-space analyses of compositional modulation in InAs/AlAs short-period superlattices

Materials Research Society Symposium - Proceedings

Volumn 583, Issue , 2000, Pages 333-347

  Follstaedt, D M ^a   Lee, S R ^a   Reno, J L ^a   Jones, E D ^b   Twesten, R D ^b   Norman, A G ^c   Ahrenkiel, S P ^c   Moutinho, H R ^d   Mascarenhasand, A ^d   Mireckimillunchick, J ^d  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SEMICONDUCTING INDIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LATERAL COMPOSITION MODULATION; REAL SPACE ANALYSES; VERTICAL SHORT PERIOD SUPERLATTICE;

SUPERLATTICES;

EID: 0033712410     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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