Reciprocal-space analysis of compositional modulation in short-period superlattices using position-sensitive x-ray detection

Journal of Materials Science: Materials in Electronics

Volumn 10, Issue 3, 1999, Pages 191-197

  Lee, S R ^a   Mirecki Millunchick, J ^a,c   Twesten, R D ^a,d   Follstaedt, D M ^a   Reno, J L ^a   Ahrenkiel, S P ^b   Norman, A G ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; NONDESTRUCTIVE EXAMINATION; PHOTODETECTORS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE; X RAY CRYSTALLOGRAPHY;

ALUMINUM ARSENIDE; COMPOSITIONAL MODULATION; INDIUM ARSENIDE; X RAY DETECTORS;

SEMICONDUCTOR SUPERLATTICES;

EID: 0345633641     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008991827724     Document Type: Article

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