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Volumn 60, Issue 19, 1999, Pages 13619-13635

Characterizing composition modulations in inas/alas short-period superlattices

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Indexed keywords


EID: 0001307154     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.13619     Document Type: Article
Times cited : (47)

References (52)
  • 5
    • 0039160448 scopus 로고
    • A. G. Cullis
    • Microscopy of Semiconducting Materials 1995, edited by A. G. Cullis and A. E. Staton-Bevan (Institute of Physics, Bristol, 1995), and references therein.
    • (1995) Microscopy of Semiconducting Materials 1995
  • 30
    • 0008463763 scopus 로고
    • Plenum, New York D. K. Smith I. C. Noym R. Jenkins T. C. Huang C. C. Goldsmith J. V. Gilfrich D. K. Bowen P. Predecki
    • S. R. Lee, B. L. Doyle, T. J. Drummond, J. W. Medernach, and R. P. Schneider, Jr., in Advances in X-Ray Analysis, edited by P. Predecki, D. K. Bowen, J. V. Gilfrich, C. C. Goldsmith, T. C. Huang, R. Jenkins, I. C. Noym, and D. K. Smith (Plenum, New York, 1995), Vol. 38, p. 201.
    • (1995) Advances in X-Ray Analysis , vol.38 , pp. 201
    • Lee, S.R.1    Doyle, B.L.2    Drummond, T.J.3    Medernach, J.W.4    Schneider, R.P.5
  • 38
    • 85037923211 scopus 로고    scopus 로고
    • (unpublished results)
    • A. G. Norman (unpublished results).
    • Norman, A.G.1
  • 41
    • 85037892168 scopus 로고    scopus 로고
    • For the relaxation valid at any thickness, see Ref. 24
    • For the relaxation valid at any thickness, see Ref. 24.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.