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Volumn 23, Issue 2, 2000, Pages 360-366

Gallium alloy interconnects for flip-chip assembly applications

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; FAILURE ANALYSIS; FATIGUE OF MATERIALS; FLIP CHIP DEVICES; INTEGRATED CIRCUIT MANUFACTURE; INTERCONNECTION NETWORKS; LAMINATES; METALLOGRAPHIC MICROSTRUCTURE; NICKEL; PRINTED CIRCUIT BOARDS; RELIABILITY;

EID: 0033706529     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.846775     Document Type: Article
Times cited : (16)

References (10)
  • 1
    • 33749875511 scopus 로고    scopus 로고
    • Semiconductor device having a layer of gallium amalgam on bump leads U.S. patent 5672913, Sept. 30
    • D. F. Baldwin and R. D. DeshmukhSemiconductor device having a layer of gallium amalgam on bump leads,"; U.S. patent 5672913, Sept. 30, 1997.
    • (1997)
    • Baldwin, D.F.1    Deshmukh, R.D.2
  • 3
    • 0029422879 scopus 로고    scopus 로고
    • Amalgams as alternative microelectronic interconnect materials
    • vol. MED-Vol. 3/EEP-vol. 14, pp. 55-63, 1995.
    • Amalgams as alternative microelectronic interconnect materials,"; Sensors Electron. Packag., ASME, vol. MED-Vol. 3/EEP-vol. 14, pp. 55-63, 1995.
    • Sensors Electron. Packag., ASME
  • 4
    • 0030100653 scopus 로고    scopus 로고
    • Preparation and properties of gallium alloys for use as microelectronic interconnect materials
    • vol. 19, pp. 37-45, 1995.
    • Preparation and properties of gallium alloys for use as microelectronic interconnect materials,"; Int. J. Microcircuits Electron. Packag., vol. 19, pp. 37-45, 1995.
    • Int. J. Microcircuits Electron. Packag.
  • 5
    • 0343707267 scopus 로고    scopus 로고
    • Hard gallium alloys for use as low contact resistance electrodes and for bonding thermocouples into samples
    • vol. 31, pp. 717-720, 1960.
    • G. G. HarmanHard gallium alloys for use as low contact resistance electrodes and for bonding thermocouples into samples,"; Rev. Sci. Instr., vol. 31, pp. 717-720, 1960.
    • Rev. Sci. Instr.
    • Harman, G.G.1
  • 6
    • 0027582919 scopus 로고    scopus 로고
    • Amalgams for improved electronics interconnection
    • 46-58, Apr. 1993.
    • C. A. MacKayAmalgams for improved electronics interconnection,"; IEEE Microelectron., pp. 46-58, Apr. 1993.
    • IEEE Microelectron., Pp.
    • MacKay, C.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.