High resolution synchrotron X-ray diffraction tomography of large-grained samples

Materials Research Society Symposium Proceedings

Volumn 437, Issue , 1996, Pages 125-128

  Piotrowski, D P ^a   Stock, S R ^a   Guvenilir, A ^a   Haase, J D ^a   Rek, Z U ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; NONDESTRUCTIVE EXAMINATION; SILICON WAFERS; SINGLE CRYSTALS; STRAIN RATE; SYNCHROTRON RADIATION; X RAY CRYSTALLOGRAPHY;

HIGH RESOLUTION SYNCHROTRON X RAY DIFFRACTION TOMOGRAPHY;

POLYCRYSTALLINE MATERIALS;

EID: 0030396638     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-437-125     Document Type: Article

References (5)