Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys

Journal of Electronic Materials

Volumn 29, Issue 6, 2000, Pages 798-803

  Peiris, F C ^a   Lee, S ^a   Bindley, U ^a   Furdyna, J K ^a  

^a UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM ALLOYS; COMPOSITION EFFECTS; DISPERSIONS; LIGHT REFLECTION; MOLECULAR BEAM EPITAXY; REFRACTIVE INDEX; SEMICONDUCTOR GROWTH;

CADMIUM ZINC TELLURIDE;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0033686785     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-000-0227-9     Document Type: Article

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