Wavelength dependence of the indices of refraction of molecular beam epitaxy-grown ZnMgSe and ZnCdSe thin films measured by two complementary techniques

Journal of Applied Physics

Volumn 86, Issue 2, 1999, Pages 918-922

  Peiris, F C ^a   Lee, S ^a   Bindley, U ^a   Furdyna, J K ^a  

^a UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000948193     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370824     Document Type: Article

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