-
1
-
-
0000166811
-
-
J.H. Joo, J.M. Seon, Y.C. Jeon, K.Y. Oh, J.S. Roh, and J.J. Kim, Appl. Phys. Lett. 70 3053 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 3053
-
-
Joo, J.H.1
Seon, J.M.2
Jeon, Y.C.3
Oh, K.Y.4
Roh, J.S.5
Kim, J.J.6
-
2
-
-
0032255102
-
-
Y. Tsunemine, T. Okudaira, K. Kashihar, K. Hanafusa, A. Yutani, Y. Fujita, M. Matsushita, H. Itoh, and H. Miyoshi, Proc. IEEE International Electron Devices Meeting Technical Digest 811 (1998).
-
(1998)
Proc. IEEE International Electron Devices Meeting Technical Digest
, pp. 811
-
-
Tsunemine, Y.1
Okudaira, T.2
Kashihar, K.3
Hanafusa, K.4
Yutani, A.5
Fujita, Y.6
Matsushita, M.7
Itoh, H.8
Miyoshi, H.9
-
4
-
-
36449005098
-
-
T. Nakamura, Y. Nakao, A. Kamisawa, and H. Takasu, Appl. Phys. Lett. 65 1522 (1994);
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 1522
-
-
Nakamura, T.1
Nakao, Y.2
Kamisawa, A.3
Takasu, H.4
-
5
-
-
0000755861
-
-
T. Nakamura, Y. Fujimori, N. Izumi, and A. Kamisawa, Jpn. J. Appl. Phys. 37 1325 (1998).
-
(1998)
Jpn. J. Appl. Phys.
, vol.37
, pp. 1325
-
-
Nakamura, T.1
Fujimori, Y.2
Izumi, N.3
Kamisawa, A.4
-
6
-
-
0032315243
-
-
H. Fujisawa, S. Hyodo, K. Jitsui, M. Shimizu, H. Niu, H. Okino, and T. Shiosaki, Integrated Ferroelectrics 21 107 (1998).
-
(1998)
Integrated Ferroelectrics
, vol.21
, pp. 107
-
-
Fujisawa, H.1
Hyodo, S.2
Jitsui, K.3
Shimizu, M.4
Niu, H.5
Okino, H.6
Shiosaki, T.7
-
7
-
-
0018456398
-
-
M. Hecq, A. Hecq, and J.P. Delrue, T. Robert, J. Less-Common Met. 64 25 (1979).
-
(1979)
J. Less-Common Met.
, vol.64
, pp. 25
-
-
Hecq, M.1
Hecq, A.2
Delrue, J.P.3
Robert, T.4
-
8
-
-
33746314324
-
-
J.R. McBride, G.W. Graham, C.R. Peters, and W.H. Weber, J. Appl. Phys. 69 1596 (1991).
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 1596
-
-
McBride, J.R.1
Graham, G.W.2
Peters, C.R.3
Weber, W.H.4
-
9
-
-
0001104843
-
-
H. Neff, S. Henkel, E. Hartmannsgruber, E. Steinbeiss, W. Michalke, K. Steenbeck, and H.G. Schmidt, J. Appl. Phys. 79 7672 (1996).
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 7672
-
-
Neff, H.1
Henkel, S.2
Hartmannsgruber, E.3
Steinbeiss, E.4
Michalke, W.5
Steenbeck, K.6
Schmidt, H.G.7
-
11
-
-
0030650912
-
-
D.Y. Park, D.S. Lee, M.H. Kim, T.S. Park, H.J. Woo, E. Yoon, D.I. Chun, and J. Ha, Mat. Res. Soc. Symp. Proc. 441 335 (1997);
-
(1997)
Mat. Res. Soc. Symp. Proc.
, vol.441
, pp. 335
-
-
Park, D.Y.1
Lee, D.S.2
Kim, M.H.3
Park, T.S.4
Woo, H.J.5
Yoon, E.6
Chun, D.I.7
Ha, J.8
-
12
-
-
0033097614
-
-
M.H. Kim, T.S. Park, D.S. Lee, E. Yoon, D.Y. Park, H.J. Woo, D.I. Chun, and J. Ha, J. Mater. Res. 14 634 (1999);
-
(1999)
J. Mater. Res.
, vol.14
, pp. 634
-
-
Kim, M.H.1
Park, T.S.2
Lee, D.S.3
Yoon, E.4
Park, D.Y.5
Woo, H.J.6
Chun, D.I.7
Ha, J.8
-
13
-
-
0032634994
-
-
M.H. Kim, T.S. Park, E. Yoon, D.S. Lee, D.Y. Park, H.J. Woo, D.I. Chun, and J. Ha, J. Mater. Res. 14 1255 (1999).
-
(1999)
J. Mater. Res.
, vol.14
, pp. 1255
-
-
Kim, M.H.1
Park, T.S.2
Yoon, E.3
Lee, D.S.4
Park, D.Y.5
Woo, H.J.6
Chun, D.I.7
Ha, J.8
-
17
-
-
0030688775
-
-
D.S. Lee, D.Y. Park, M.H. Kim, D.I. Chun, J. Ha, and E. Yoon, Mat. Res. Soc. Symp. Proc. 441 341 (1997);
-
(1997)
Mat. Res. Soc. Symp. Proc.
, vol.441
, pp. 341
-
-
Lee, D.S.1
Park, D.Y.2
Kim, M.H.3
Chun, D.I.4
Ha, J.5
Yoon, E.6
-
18
-
-
33750996255
-
-
U.S. Patent No. 5 736 422 (7 April 1998)
-
D.S. Lee, D.I. Chun, D.Y. Park, J.W. Ha, E.J. Yoon, M.H. Kim, H.J. Woo, U.S. Patent No. 5 736 422 (7 April 1998).
-
-
-
Lee, D.S.1
Chun, D.I.2
Park, D.Y.3
Ha, J.W.4
Yoon, E.J.5
Kim, M.H.6
Woo, H.J.7
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