메뉴 건너뛰기




Volumn 33, Issue 11, 2000, Pages 781-789

Measurement of orientation in organic thin films

Author keywords

[No Author keywords available]

Indexed keywords

ORGANIC COMPOUND;

EID: 0033678467     PISSN: 00014842     EISSN: None     Source Type: Journal    
DOI: 10.1021/ar0000307     Document Type: Article
Times cited : (48)

References (21)
  • 6
    • 0027230653 scopus 로고
    • Insitu optical spectroscopy of surfaces and interfaces with submonolayer resolution
    • (1993) Appl. Surf. Sci. , vol.63 , pp. 99-105
    • McGilp, J.F.1
  • 9
    • 0001066994 scopus 로고
    • Roughness spectrum and surface width of self-affine fractal surfaces via the K-correlation model
    • (1993) Phys. Rev. B , vol.48 , pp. 14472-14478
    • Palasantzas, G.1
  • 14
    • 0033599491 scopus 로고    scopus 로고
    • An SHG magic angle: Dependence of second harmonic generation orientation measurements on the width of the orientation distribution
    • and references therein
    • (1999) J. Am. Chem. Soc. , vol.120 , pp. 7997-7998
    • Simpson, G.J.1    Rowlen, K.L.2
  • 17
    • 4243330859 scopus 로고
    • Molecular orientation in thin films as probed by optical second harmonic generation
    • Characterization of Organic Thin Films; Ulman, A., Ed.; Butterworth-Heinemann: Stoneham, MA, Chapter 12
    • (1995)
    • Corn, R.M.1    Higgins, D.A.2
  • 18
    • 0001269029 scopus 로고
    • Irreducible tensor analysis of sum-frequency and difference-frequency-generation in partially oriented samples
    • (1985) Chem. Phys. , vol.96 , pp. 199-215
    • Dick, B.1
  • 20
    • 0034254562 scopus 로고    scopus 로고
    • Orientation insensitive methodology for second harmonic generation. Part II: Application to adsorption isotherm and kinetics measurements
    • (2000) Anal. Chem. , vol.72 , pp. 3407-3411
    • Simpson, G.J.1    Rowlen, K.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.