Influence of substrate roughness on orientation measurements by second-harmonic generation

Chemical Physics Letters

Volumn 317, Issue 3-5, 2000, Pages 276-281

  Simpson, Garth J ^a   Rowlen, Kathy L ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000872767     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(99)01407-4     Document Type: Article

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