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Volumn 30, Issue 19, 1997, Pages 2656-2662

Ellipsometric depth profiling of the refractive index: A neural network method and its application to a surface-induced inhomogeneity in a liquid crystal

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELLIPSOMETRY; NEMATIC LIQUID CRYSTALS; NEURAL NETWORKS; PATTERN RECOGNITION; REFRACTIVE INDEX;

EID: 0031558549     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/30/19/002     Document Type: Article
Times cited : (6)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.