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Volumn 30, Issue 19, 1997, Pages 2656-2662
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Ellipsometric depth profiling of the refractive index: A neural network method and its application to a surface-induced inhomogeneity in a liquid crystal
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELLIPSOMETRY;
NEMATIC LIQUID CRYSTALS;
NEURAL NETWORKS;
PATTERN RECOGNITION;
REFRACTIVE INDEX;
ISOTROPIC PHASE;
OPTICAL MATERIALS;
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EID: 0031558549
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/30/19/002 Document Type: Article |
Times cited : (6)
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References (31)
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