All-polymer optoelectronic devices

Science

Volumn 285, Issue 5425, 1999, Pages 233-236

  Ho, Peter K H ^a   Thomas, D Stephen ^a   Friend, Richard H ^a   Tessler, Nir ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; MIRRORS; NANOSTRUCTURED MATERIALS; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SEMICONDUCTING POLYMERS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING; SILICA; VINYL RESINS;

ALL-POLYMER OPTOELECTRONIC DEVICES;

OPTOELECTRONIC DEVICES;

NANOPARTICLE; POLYMER;

ARTICLE; ELECTRONICS; INSTRUMENTATION; LIGHT; OPTICS; PRIORITY JOURNAL; SEMICONDUCTOR;

EID: 0033538577     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.285.5425.233     Document Type: Article

References (28)

1. A. Dodabalapur et al., Appl. Phys. Lett. 73, 142 (1998).
2. H. Sirringhaus, N. Tessler, R. H. Friend, Science 280, 1741 (1998).
3. A. J. Heeger, Solid State Commun. 107, 673 (1998).
4. R. H. Friend et al., Nature 397, 121 (1999).
5. S. Brittain, K. Paul, X.-M. Zhao, G. Whitesides, Phys. World 1998, 31 (May 1998).
6. D. W. V. Krevelen, Properties of Polymers: Their Correlation with Chemical Structure, Their Numerical Estimation and Prediction from Additive Group Contributions (Elsevier, Amsterdam, ed. 3, 1990).
7. M. P. Pileni, J. Phys. Chem. 97, 6961 (1993).
8. S. A. Carter, J. C. Scott, P. J. Brock, Appl. Phys. Lett. 71, 1145 (1997).
9. B. J. Schwartz, F. Hide, M. A. Díaz-García, M. R. Andersson, A. J. Heeger, Philos. Trans. R. Soc. London Ser. A 355, 775 (1997).
10. A. Yamamori, C. Adachi, T. Koyama, Y. Taniguchi, Appl. Phys. Lett. 72, 2147 (1998).
11. C. C. Han and R. L. Elsenbaumer, Synth. Met. 30, 123 (1989).
12. N. Tessler, N. T. Harrison, R. H. Friend, Adv. Mater. 10, 64 (1998).
13. H. Yokohama, Science 256, 66 (1992).
14. E. F. Schubert et al., ibid. 265, 943 (1994).
15. D. G. Lidzey et al., Nature 395, 53 (1998).
16. T. Granlund et al., Chem. Phys. Lett. 288, 879 (1998).
17. T. Nakayama, Y. Itoh, A. Kakuta, Appl. Phys. Lett. 63, 594 (1993).
18. R. H. Jordan, L. J. Rothberg, A. Dodabalapur, R. E. Slusher, ibid. 69, 1997 (1996).
19. J. Grüner, F. Cacialli, R. H. Friend, J. Appl. Phys. 80, 207 (1996).
20. P. W. M. Blom, H. F. M. Schoo, M. Matters, Appl. Phys. Lett. 73, 3914 (1998).
21. J. C. Carter et al., ibid. 71, 34 (1997).
22. A. Sakamoto, Y. Furukawa, M. Tasumi, J. Phys. Chem. B 101, 1726 (1997).
23. A. C. Arias, M. G. Granström, D. S. Thomas, R. H. Friend, Phys. Rev. B, in press.
24. M. G. Harrison, K. E. Ziemelis, R. H. Friend, P. L. Burn, A. B. Holmes, Synth. Met. 55, 218 (1993).
25. E. F. Schubert, N. E. J. Hunt, R. J. Malik, M. Micovic, D. L. Miller, J. Lightwave Technol. 14, 1721 (1996).
26. N. Tessler, S. Burns, H. Becker, R. H. Friend, Appl. Phys. Lett. 70, 556 (1997).
27. K. Tai, L. Yang, Y. H. Wang, J. D. Wynn, A. Y. Cho, ibid. 56, 2496 (1990).
28. This work has been partially supported by the European Commission under Brite-Euram contract BRPR-CT97-0469 ("OSCA") and by the Engineering and Physical Sciences Research Council. We thank Cambridge Display Technology (Cambridge, UK) for materials, R. A. L. Jones and A. Wehrum for the spectroscopic eltipsometer facility, and E. P. Woo at The Dow Chemical Company (Midland, MI) for support. P.K.H.H. is on study leave from the National University of Singapore and thanks St. John's College (Cambridge, UK) and the Institute of Materials Research and Engineering (Singapore) for funding.