Experimental verification of a new quantification procedure for elemental mapping by analytical X-ray microscopy

Ultramicroscopy

Volumn 65, Issue 3-4, 1996, Pages 159-177

  Rondot, S ^a   Cazaux, J ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; CHROMIUM ALLOYS; DEPOSITION; DISSOLUTION; NICKEL ALLOYS; SURFACE STRUCTURE; TERNARY SYSTEMS; X RAY ANALYSIS;

ELEMENTAL MAPPING; SURFACE ATOMIC DENSITY; X RAY MICROSCOPY;

MICROSCOPIC EXAMINATION;

ARTICLE; MICROSCOPY; X RAY ANALYSIS;

EID: 0030271562     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00066-6     Document Type: Article

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