Core level photoelectron spectroscopy for polymer and catalyst characterisation

Chemical Society Reviews

Volumn 28, Issue 4, 1999, Pages 233-238

  Pijpers, A Paul ^a   Meier, Robert J ^a  

^a DSM RESEARCH   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033456128     PISSN: 03060012     EISSN: None     Source Type: Journal    
DOI: 10.1039/a807826b     Document Type: Article

References (33)

1. K. Siegbahn, C. Nordling, G. Johansson, J. Hedman, P. F. Heden, K. Hamrin, U. Gelius, T. Bergmark, L. O. Werne, R. Manne and Y. Baer, ESCA Applied to Free Molecules, 1969, North-Holland Publishing Company, Amsterdam, London.
2. K. Siegbahn, C. Nordling, A. Fahlman, R. Nordberg, K. Hamrin, J. Hedman, G. Johansson, T. Bergmark, S. E. Karlsson, I. Lindgren and B. Lindberg, ESCA - Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy, Uppsala, 1967. Nova Acta Regiae Soc. Sci. Ups. Ser. IV, 20, 1967.
3. K. Siegbahn, C. Nordling, A. Fahlman, R. Nordberg, K. Hamrin, J. Hedman, G. Johansson, T. Bergmark, S. E. Karlsson, I. Lindgren and B. Lindberg, ESCA - Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy, Uppsala, 1967. Nova Acta Regiae Soc. Sci. Ups. Ser. IV, 20, 1967.
4. C. Sleigh, A. P. Pijpers, A. Jaspers, B. Coussens and R. J. Meier, J. Electron Spectrosc. Relat. Phenom., 1996, 77, 41.
5. D. Briggs and M. P. Seah, Practical Surface Analysis, vol. 1, 2nd edn., Wiley, Chichester, 1990.
6. W. L. Jolly, K. D. Bomben and C. J. Eyermann, At. Nucl. Data Tables, 1984, 31, 433.
7. J. J. Pireaux, J. Riga, R. Caudano, J. J. Verbist, J. M. Andre, J. Delhalle and S. Delhalle, J. Electron Spectrosc. Relat. Phenom., 1974, 5, 531.
8. R. J. Meier, J. Mol. Struct. (THEOCHEM), 1988, 181, 81.
9. R. J. Meier and A. P. Pijpers, Theor. Chim. Acta, 1989, 75, 261.
10. P. Sundberg, C. Andersson, B. Folkesson and R. Larsson, J. Electron Spectrosc. Relat. Phenom., 1988, 46, 85.
11. B. Folkesson and R. Larsson, J. Electron Spectrosc. Relat. Phenom., 1990, 50, 267.
12. M. Keenlyside and P. Pianetta, J. Electron Spectrosc. Relat. Phenom., 1993, 66, 189.
13. C. Coluzza and R. Moburg, J. Electron Spectrosc. Relat. Phenom., 1997, 84, 109.
14. A. P. Pijpers, in Scientific Methods for the Study of Polymer Colloids and their Applications, eds. F. Candau and R. H. Ottewill, Kluwer Academic Publishers, 1990, p. 291.
15. G. Beamson and D. Briggs, High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database, 1992, Wiley, Chichester.
16. D. Briggs, Surface Analysis of Polymers by XPS and Static SIMS, Cambridge University Press, Cambridge, 1998.
17. G. Beamson, D. T. Clark, J. Kendrick and D. Briggs, J. Electron Spectrosc. Relat. Phenom., 1991, 57, 79.
18. L. Sabbatini and P. G. Zambonin, J. Electron Spectrosc. Relat. Phenom., 1996, 81, 285.
19. C. M. Kassis, J. K. Steehler, D. E. Betts, Z. Guan, T. J. Romack, J. M. DeSimone and R. W. Linton, Macromolecules, 1996, 29, 3247.
20. L. Li, C.-M. Chan and L. T. Weng, Macromolecules, 1997, 30, 3698.
21. S. R. Leadly and J. F. Watts, Polymer-Solid Interfaces: from Model to Real Systems, ICPSI-2, Proceedings of the Second International Conference, eds. J.-J. Pireaux, J. Delhalle and P. Rudolf, Presses Universitaires de Namur, 1998.
22. A. A. Galuska and D. E. Halverson, Surf. Interface Anal., 1998, 26, 425.
23. G. Beamson, D. T. Clark, N. W. Hayes, D. S.-L. Law, V. Siracusa and A. Recca, Polymer, 1996, 37, 379.
24. A. Tarazona, E. Koglin, A. P. Pijpers and R. J. Meier, Polymer, 1997, 38, 2615.
25. C. D. Batich, Appl. Surf. Sci., 1988, 32, 57.
26. New Catalytic Materials: Volume XI. State-of-the-art techniques for catalyst characterisation, 1984, Catalytica Associates, Inc., California, USA.
27. S. C. Avanzino, H.-W. Chen, C. J. Donahue and W. L. Jolly, Inorg. Chem., 1980, 19, 2201.
28. M. Casamassima, E. Darque-Ceretti, A. Etcheberry and M. Aucouturier, J. Mater. Sci., 1993, 28, 3997.
29. H. J. M. Bosman, A. P. Pijpers and A. W. M. A. Jaspers, J. Catal., 1996, 161, 551.
30. F. Verpoort, A. R. Bossuyt and L. Verdonck, J. Electron Spectrosc. Relat. Phenom., 1996, 82, 151.
31. J. N. Anderson, D. Hennig, E. Lundgren, M. Methfessel, R. Nyholm and M. Scheffler, Phys. Rev. B, 1994, 50, 17525.
32. R. Nyholm, M. Qvarford, J. N. Andersen, S. L. Sorensen and C. Wigren, J. Phys.: Condens. Matter, 1992, 4, 277.
33. J. N. Andersen, A. Beutler, S. L. Sorensen, R. Nyholm, B. Setlik and D. Heskett, Chem. Phys. Lett., 1997, 269, 371.