Olefin metathesis catalyst. III. Angle-resolved XPS and depth profiling study of a tungsten oxide layer on silica

Journal of Electron Spectroscopy and Related Phenomena

Volumn 82, Issue 3, 1996, Pages 151-163

  Verpoort, F ^a   Bossuyt, A R ^a   Verdonck, L ^a,b  

^a GHENT UNIVERSITY   (Belgium)

^b Divisie Organometaalchemie Katalyse   (Belgium)

Author keywords

Angle resolved X ray photoelectron spectroscopy; Catalyst; Depth profiling; WOx SiO2 Si (100); X ray photoelectron spectroscopy

Indexed keywords

EID: 0039909249     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(96)03058-7     Document Type: Article

References (28)

1. P.A. Spevack and S. McIntyre, Appl. Catal., 64 (1990) 191.
2. E.G. Frederick, G. Apai and T.N. Rhodin, J. Am. Chem. Soc., 109 (1987) 4797.
3. Samples provided by PHILIPS, Eindhoven.
4. F. Verpoort, L. Fiermans, A.R. Bossuyt and L. Verdonck, J. Mol. Cat., 90 (1994) 43.
5. S. Tanuma, C.J. Powell and D.R. Penn, Surf. Interface. Anal., 11 (1988) 577.
6. J.J. Eisch and R.B. King, Organomet. Synth., 1 (1965) 65.
7. W. Grünert, E.S. Shpiro, R. Feldhaus, K. Anders, G.V. Antoshin and Kh.M. Minachev, J. Catal., 107 (1987) 522.
8. J.H. Scofield, J. Electron Spectrosc. Relat. Phenom., 8 (1976) 129.
9. L. Salvati, Jr., L.E. Makorsky, J.M. Stencel, F.R. Brown and D.M. Hercules, J. Phys. Chem., 85 (1981) 3700.
10. L.L. Murrell, D.C. Grenoble, R.T. Baker, E.B. Perstridge, S.C. Fung, R.R. Chianelli and S.P. Cramer, J. Catal., 79 (1983) 203.
11. V. Keller, M. Cheval, F. Maire, P. Wehrer, R. Ducros and G. Maire, Catal. Today, 17 (1993) 493.
12. E. Gorlich, A. Stoch and J. Stoch, J. Solid State Chem., 33 (1980) 121.
13. A. Stoch and J. Stoch, Mater. Chem., 6 (1981) 335.
14. G. Hollinger, Y. Jugnett, P. Pertosa and Tran Minh Duc, Chem. Phys. Lett., 36 (1975) 441.
15. G.B. Wills, J. Fathikalajahi, S.K. Gangwal and S. Tang, Reel. Trav. Chim Pays-Bas, 96 (1977) M110.
16. E.T. Paul Benny and J. Majhi, J. Electron Spectrosc. Relat. Phenom., 58 (1992) 261.
17. C.C. Williams, J.G. Ekerdt, J.-M. Jehng, F.D. Hardcastle, A.M. Turek and I.E. Wachs, J. Phys. Chem., 95 (1991) 8781.
18. S.R. Stampfl, Y. Chen, J.A. Dumesic, C. Niu, C.G., Jr. Hill, J. Catal., 105 (1987) 445.
19. M. de Boir, A.J. van Dillen, D.C. Koningsberger, J.W. Geus, M.A. Vuurman, I.E. Wachs, Catal. Lett., 11 (1991) 227.
20. R.D. Roark, S.D. Kohler, J.G. Ekerdt, S.D. Kim and I.E. Wachs, Catal. Lett., 16 (1992) 77.
21. J. Engelhardt, J. Goldwasser and W.K. Hall, J. Catal., 70 (1981) 364.
22. R.L. Banks, J. Mol. Catal., 8 (1980) 269.
23. B. Zhang, N. Liu, Q. Lin and D. Jin, J. Mol. Catal., 65 (1991) 15.
24. R. Thomas and J.A. Moulijn, J. Mol. Catal., 15 (1982) 157.
25. B.N. Shelimov, I.V. Elev and V.B. Kazansky, J. Catal., 98 (1986) 70.
26. A.M. de Jong, L.M. Eshelman, L.J. van Ijzendoorn and J.W. Niemantsverdriet, Surf. Interface Anal., 18 (1992) 412.
27. T. Huizinga, H.F. vant Blik, J.C. Vis and R. Prins, Surf. Sci., 135 (1983) 580.
28. W. Grünert, E.S. Shpiro, R. Feldhaus, K. Anders, G.V. Antoshin and Kh.M. Minachev, J. Catal., 100 (1986) 138.