Chemical Effects in Soft X-Ray Spectra even with Multilayers: Silicon L Spectra Using a '300 Å' Device

X-Ray Spectrometry

Volumn 25, Issue 1, 1996, Pages 15-20

  Habulihaz, Bahanu ^a,b   Martins, E ^a   Gamblin, S ^a   Urch, D S ^a  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^b Chengdu Analytical and Testing Center for Minerals and Rocks Bureau of Geology and Mineral Resources   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; SILICA; SILICON; SILICON CARBIDE; SILICON OXIDES; SPECTROMETERS; X RAY SCATTERING;

CHEMICAL EFFECT; EMISSION SPECTROMETERS; GRATING SPECTROMETERS; HIGH RESOLUTION; L SPECTRA; SECOND ORDERS; SOFT-X-RAY SPECTRA; X-RAY EMISSION; X-RAY EMISSION SPECTRA;

MULTILAYERS;

EID: 0009536518     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199601)25:1<15::AID-XRS131>3.0.CO;2-K     Document Type: Article

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