Recent measurements of long‐wavelength x‐rays using synthetic multilayers

X‐Ray Spectrometry

Volumn 18, Issue 2, 1989, Pages 53-56

  Huang, T C ^a   Fung, A ^a   White, R L ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

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Indexed keywords

EID: 84973308342     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1300180204     Document Type: Article

References (9)