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Volumn 273-274, Issue , 1999, Pages 729-732

Extrinsic and intrinsic defects at molecular-beam-epitaxy regrown GaAs interfaces

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; CAPACITANCE MEASUREMENT; CARBON; CARRIER CONCENTRATION; CRYSTAL DEFECTS; ELECTRONIC PROPERTIES; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; VOLTAGE MEASUREMENT;

EID: 0033357799     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00624-9     Document Type: Article
Times cited : (1)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.