|
Volumn 273-274, Issue , 1999, Pages 729-732
|
Extrinsic and intrinsic defects at molecular-beam-epitaxy regrown GaAs interfaces
a
EPFL
(Switzerland)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ARSENIC;
CAPACITANCE MEASUREMENT;
CARBON;
CARRIER CONCENTRATION;
CRYSTAL DEFECTS;
ELECTRONIC PROPERTIES;
INTERFACES (MATERIALS);
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
VOLTAGE MEASUREMENT;
EPITAXIAL LAYERS;
SEMICONDUCTING GALLIUM ARSENIDE;
|
EID: 0033357799
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(99)00624-9 Document Type: Article |
Times cited : (1)
|
References (13)
|