Failure analysis case studies using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method

Proceedings of the Asian Test Symposium

Volumn , Issue , 1999, Pages 394-399

  Nikawa, Kiyoshi ^a   Inoue, Shoji ^a   Morimoto, Kazuyuki ^a   Sone, Shinya ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED OPTICAL BEAM INDUCED RESISTANCE CHANGE (IR-OBIRCH) METHODS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; DYNAMIC RANDOM ACCESS STORAGE; FAILURE ANALYSIS; INFRARED RADIATION;

INTEGRATED CIRCUIT TESTING;

EID: 0033355564     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (16)

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