Dynamic test set generation for analog circuits and systems

Proceedings of the Asian Test Symposium

Volumn , Issue , 1998, Pages 360-365

  Huynh, Sam ^a   Kim, Seongwon ^a   Soma, Mani ^a   Zhang, Jinyan ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG CIRCUITS;

MIXER CIRCUITS; SIGNAL GENERATORS; TRANSFER FUNCTIONS;

INTEGRATED CIRCUIT TESTING;

EID: 0032296107     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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2. R. Voorakaranam, S. Chakrabarti, J. Hou, A. Gomes, S. Cherubal and A. Chatterjee, "Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis," Proc. of the International Test Conference, pp. 903-912, 1997.
3. B. Kaminska, K. Arabi, I. Bell, P. Goteti, J. L. Huertas, B. Kim, A. Rueda, and M. Soma, "Analog and Mixed-Signal Benchmark Circuits-First Release," Proc. of the ITC, pp. 183-190, 1997.
4. M. Slamani and B. Kaminska, "Multifrequency Testability Analysis for Analog Circuits," Proc. of the VTS, pp. 54-59, 1994.
5. N. Nagi and J. A. Abraham, "Fault-based Automatic Test Generator for Linear Analog Circuits," Proc. of ICCAD, pp. 88-91, 1993.
6. L. Milor and V. Visvanathan, "Detection of Catastrophic Faults in Analog Integrated Circuits," IEEE Trans. CAD, vol. CAD-8, no. 2, pp. 114-130, February 1989.
7. J. E. Stephenson and J. Grason, "A Testability Measure for Register Transfer Level Digital Circuits," IEEE Fault-Tolerant Computing, pp. 101-107, 1976.
8. M. Ismail and T. Fiez, Analog VLSI Signal and Information Processing, McGraw-Hill, Chapter 12, "Design for Testability," 1994.