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Volumn , Issue , 1998, Pages 360-365
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Dynamic test set generation for analog circuits and systems
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALOG CIRCUITS;
MIXER CIRCUITS;
SIGNAL GENERATORS;
TRANSFER FUNCTIONS;
INTEGRATED CIRCUIT TESTING;
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EID: 0032296107
PISSN: 10817735
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (8)
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