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Volumn , Issue , 1998, Pages 376-383
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Testability analysis and multi-frequency ATPG for analog circuits and systems
a
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Author keywords
[No Author keywords available]
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Indexed keywords
COST EFFECTIVENESS;
FAILURE ANALYSIS;
LINEAR INTEGRATED CIRCUITS;
FAULT DETECTABILITY;
TESTABILITY TRANSFER FACTORS;
INTEGRATED CIRCUIT TESTING;
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EID: 0032318393
PISSN: 10923152
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/288548.289057 Document Type: Conference Paper |
Times cited : (17)
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References (11)
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