Testability analysis and multi-frequency ATPG for analog circuits and systems

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1998, Pages 376-383

  Huynh, Sam D ^a   Kim, Seongwon ^a   Soma, Mani ^a   Zhang, Jinyan ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; FAILURE ANALYSIS; LINEAR INTEGRATED CIRCUITS;

FAULT DETECTABILITY; TESTABILITY TRANSFER FACTORS;

INTEGRATED CIRCUIT TESTING;

EID: 0032318393     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/288548.289057     Document Type: Conference Paper

References (11)