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Volumn 77, Issue 2, 1999, Pages 81-97

Characterization of the anisotropic chemical attack of {hk0} silicon plates in a T.M.A.H. solution. Determination of a database

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CHEMICAL ATTACK; DATABASE SYSTEMS; ETCHING; MATHEMATICAL MODELS; SILICON; SURFACES; WATER;

EID: 0033349916     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00020-5     Document Type: Article
Times cited : (22)

References (25)
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